BibTeX record journals/tc/HamdiouiG02

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@article{DBLP:journals/tc/HamdiouiG02,
  author       = {Said Hamdioui and
                  Ad J. van de Goor},
  title        = {Efficient Tests for Realistic Faults in Dual-Port SRAMs},
  journal      = {{IEEE} Trans. Computers},
  volume       = {51},
  number       = {5},
  pages        = {460--473},
  year         = {2002},
  url          = {https://doi.org/10.1109/TC.2002.1004586},
  doi          = {10.1109/TC.2002.1004586},
  timestamp    = {Mon, 27 Apr 2020 23:41:20 +0200},
  biburl       = {https://dblp.org/rec/journals/tc/HamdiouiG02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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