Pseudoexhaustive Test Pattern Generator with Enhanced Fault Coverage.

P. Golan Ondrej Novák Jan Hlavicka Pseudoexhaustive Test Pattern Generator with Enhanced Fault Coverage. 496-500 1988 37 IEEE Trans. Computers 4 db/journals/tc/tc37.html#GolanNH88 http://doi.ieeecomputersociety.org/10.1109/12.2198