@article{DBLP:journals/tc/DavidFC89,
author = {Ren{\'e} David and
Antoine Fuentes and
Bernard Courtois},
title = {Random Pattern Testing Versus Deterministic Testing of RAM's},
journal = {IEEE Trans. Computers},
volume = {38},
number = {5},
year = {1989},
pages = {637-650},
ee = {http://doi.ieeecomputersociety.org/10.1109/12.24267},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Last update 2009-06-10 CET by the DBLP Team — 
Data released under the ODC-BY 1.0 license — See also our legal information page
