BibTeX record journals/tc/ChoiOLK18

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@article{DBLP:journals/tc/ChoiOLK18,
  author       = {Inhyuk Choi and
                  Hyunggoy Oh and
                  Young{-}Woo Lee and
                  Sungho Kang},
  title        = {Test Resource Reused Debug Scheme to Reduce the Post-Silicon Debug
                  Cost},
  journal      = {{IEEE} Trans. Computers},
  volume       = {67},
  number       = {12},
  pages        = {1835--1839},
  year         = {2018},
  url          = {https://doi.org/10.1109/TC.2018.2835462},
  doi          = {10.1109/TC.2018.2835462},
  timestamp    = {Tue, 27 Feb 2024 16:41:39 +0100},
  biburl       = {https://dblp.org/rec/journals/tc/ChoiOLK18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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