@article{DBLP:journals/tc/ChenG96,
author = {Chih-Ang Chen and
Sandeep K. Gupta},
title = {BIST Test Pattern Generators for Two-Pattern Testing-Theory
and Design Algorithms},
journal = {IEEE Trans. Computers},
volume = {45},
number = {3},
year = {1996},
pages = {257-269},
ee = {http://doi.ieeecomputersociety.org/10.1109/12.485565},
bibsource = {DBLP, http://dblp.uni-trier.de}
}