BibTeX record journals/tase/FanHTHC20

download as .bib file

@article{DBLP:journals/tase/FanHTHC20,
  author       = {Shu{-}Kai S. Fan and
                  Chia{-}Yu Hsu and
                  Du{-}Ming Tsai and
                  Fei He and
                  Chun{-}Chung Cheng},
  title        = {Data-Driven Approach for Fault Detection and Diagnostic in Semiconductor
                  Manufacturing},
  journal      = {{IEEE} Trans Autom. Sci. Eng.},
  volume       = {17},
  number       = {4},
  pages        = {1925--1936},
  year         = {2020},
  url          = {https://doi.org/10.1109/TASE.2020.2983061},
  doi          = {10.1109/TASE.2020.2983061},
  timestamp    = {Tue, 20 Oct 2020 18:27:16 +0200},
  biburl       = {https://dblp.org/rec/journals/tase/FanHTHC20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.