BibTeX record journals/systems/VuCK24

download as .bib file

@article{DBLP:journals/systems/VuCK24,
  author       = {Thi{-}Thu{-}Huyen Vu and
                  Tai{-}Woo Chang and
                  Haejoong Kim},
  title        = {Enhancing Quality Control in Battery Component Manufacturing: Deep
                  Learning-Based Approaches for Defect Detection on Microfasteners},
  journal      = {Syst.},
  volume       = {12},
  number       = {1},
  pages        = {24},
  year         = {2024},
  url          = {https://doi.org/10.3390/systems12010024},
  doi          = {10.3390/SYSTEMS12010024},
  timestamp    = {Thu, 29 Feb 2024 20:54:50 +0100},
  biburl       = {https://dblp.org/rec/journals/systems/VuCK24.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.