<?xml version="1.0"?>
<dblp>
<article key="journals/stvr/NeukirchenZGBE08" mdate="2008-09-23">
<author>Helmut Neukirchen</author>
<author>Benjamin Zeiss</author>
<author>Jens Grabowski</author>
<author>Paul Baker</author>
<author>Dominic Evans</author>
<title>Quality assurance for TTCN-3 test specifications.</title>
<pages>71-97</pages>
<year>2008</year>
<volume>18</volume>
<journal>Softw. Test., Verif. Reliab.</journal>
<number>2</number>
<ee>http://dx.doi.org/10.1002/stvr.379</ee>
<url>db/journals/stvr/stvr18.html#NeukirchenZGBE08</url>
</article>
</dblp>
