BibTeX record journals/stvr/ChenURER02

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@article{DBLP:journals/stvr/ChenURER02,
  author       = {Wei Chen and
                  Roland H. Untch and
                  Gregg Rothermel and
                  Sebastian G. Elbaum and
                  Jeffery von Ronne},
  title        = {Can fault-exposure-potential estimates improve the fault detection
                  abilities of test suites?},
  journal      = {Softw. Test. Verification Reliab.},
  volume       = {12},
  number       = {4},
  pages        = {197--218},
  year         = {2002},
  url          = {https://doi.org/10.1002/stvr.257},
  doi          = {10.1002/STVR.257},
  timestamp    = {Wed, 01 Apr 2020 08:46:05 +0200},
  biburl       = {https://dblp.org/rec/journals/stvr/ChenURER02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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