BibTeX record journals/sigsoft/NairS10a

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@article{DBLP:journals/sigsoft/NairS10a,
  author       = {T. R. Gopalakrishnan Nair and
                  V. Suma},
  title        = {A paradigm for metric based inspection process for enhancing defect
                  management},
  journal      = {{ACM} {SIGSOFT} Softw. Eng. Notes},
  volume       = {35},
  number       = {3},
  pages        = {1},
  year         = {2010},
  url          = {https://doi.org/10.1145/1764810.1764827},
  doi          = {10.1145/1764810.1764827},
  timestamp    = {Thu, 17 Sep 2020 12:05:09 +0200},
  biburl       = {https://dblp.org/rec/journals/sigsoft/NairS10a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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