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BibTeX record journals/scjapan/YokoyamaTN94
@article{DBLP:journals/scjapan/YokoyamaTN94, author = {Hiroshi Yokoyama and Hideo Tamamoto and Yuichi Narita}, title = {Built-in current testing for {CMOS} logic circuits using random patterns}, journal = {Syst. Comput. Jpn.}, volume = {25}, number = {11}, pages = {1--10}, year = {1994}, url = {https://doi.org/10.1002/scj.4690251101}, doi = {10.1002/SCJ.4690251101}, timestamp = {Wed, 13 Sep 2023 17:54:15 +0200}, biburl = {https://dblp.org/rec/journals/scjapan/YokoyamaTN94.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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