BibTeX record journals/scjapan/TakahashiWMT97

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@article{DBLP:journals/scjapan/TakahashiWMT97,
  author       = {Hiroshi Takahashi and
                  Takashi Watanabe and
                  Toshiyuki Matsunaga and
                  Yuzo Takamatsu},
  title        = {Tests for small gate delay faults in combinational circuits and a
                  test generation method},
  journal      = {Syst. Comput. Jpn.},
  volume       = {28},
  number       = {6},
  pages        = {68--76},
  year         = {1997},
  url          = {https://doi.org/10.1002/(SICI)1520-684X(19970615)28:6\<68::AID-SCJ8\>3.0.CO;2-K},
  doi          = {10.1002/(SICI)1520-684X(19970615)28:6\<68::AID-SCJ8\>3.0.CO;2-K},
  timestamp    = {Wed, 13 Sep 2023 17:54:10 +0200},
  biburl       = {https://dblp.org/rec/journals/scjapan/TakahashiWMT97.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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