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BibTeX record journals/scjapan/NakamaeIF00
@article{DBLP:journals/scjapan/NakamaeIF00, author = {Koji Nakamae and Takashi Ishimura and Hiromu Fujioka}, title = {{EB} tester fault localization algorithm for combinational circuits by utilizing fault simulation and test pattern sequence for {EB} tester}, journal = {Syst. Comput. Jpn.}, volume = {31}, number = {8}, pages = {41--48}, year = {2000}, url = {https://doi.org/10.1002/1520-684X(200007)31:8\<41::AID-SCJ5\>3.0.CO;2-E}, doi = {10.1002/1520-684X(200007)31:8\<41::AID-SCJ5\>3.0.CO;2-E}, timestamp = {Wed, 13 Sep 2023 17:54:06 +0200}, biburl = {https://dblp.org/rec/journals/scjapan/NakamaeIF00.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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