BibTeX record journals/scjapan/KajiharaIK91

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@article{DBLP:journals/scjapan/KajiharaIK91,
  author       = {Seiji Kajihara and
                  Noriyoshi Itazaki and
                  Kozo Kinoshita},
  title        = {Stuck-open faults test generation for cmos combinational circuits},
  journal      = {Syst. Comput. Jpn.},
  volume       = {22},
  number       = {9},
  pages        = {33--42},
  year         = {1991},
  url          = {https://doi.org/10.1002/scj.4690220904},
  doi          = {10.1002/SCJ.4690220904},
  timestamp    = {Wed, 13 Sep 2023 17:54:18 +0200},
  biburl       = {https://dblp.org/rec/journals/scjapan/KajiharaIK91.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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