BibTeX record journals/ress/YunN10

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@article{DBLP:journals/ress/YunN10,
  author       = {Won Young Yun and
                  Toshio Nakagawa},
  title        = {Replacement and inspection policies for products with random life
                  cycle},
  journal      = {Reliab. Eng. Syst. Saf.},
  volume       = {95},
  number       = {3},
  pages        = {161--165},
  year         = {2010},
  url          = {https://doi.org/10.1016/j.ress.2009.09.003},
  doi          = {10.1016/J.RESS.2009.09.003},
  timestamp    = {Tue, 25 Feb 2020 08:58:54 +0100},
  biburl       = {https://dblp.org/rec/journals/ress/YunN10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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