BibTeX record journals/qre/ParkPM23

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@article{DBLP:journals/qre/ParkPM23,
  author       = {You{-}Jin Park and
                  Rong Pan and
                  Douglas C. Montgomery},
  title        = {A novel hybrid resampling for semiconductor wafer defect bin classification},
  journal      = {Qual. Reliab. Eng. Int.},
  volume       = {39},
  number       = {1},
  pages        = {67--80},
  year         = {2023},
  url          = {https://doi.org/10.1002/qre.3217},
  doi          = {10.1002/QRE.3217},
  timestamp    = {Sat, 25 Feb 2023 21:35:30 +0100},
  biburl       = {https://dblp.org/rec/journals/qre/ParkPM23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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