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DBLP Record 'journals/pr/KimCMP99'

BibTeX

@article{DBLP:journals/pr/KimCMP99,
  author    = {Tae-Hyeon Kim and
               Tai-Hoon Cho and
               Young Shik Moon and
               Sung-Han Park},
  title     = {Visual inspection system for the classification of solder
               joints},
  journal   = {Pattern Recognition},
  volume    = {32},
  number    = {4},
  year      = {1999},
  pages     = {565-575},
  ee        = {http://dx.doi.org/10.1016/S0031-3203(98)00103-4},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

Copyright © 2004-03-08 by Michael Ley (ley@uni-trier.de)