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@article{DBLP:journals/pr/KimCMP99,
author = {Tae-Hyeon Kim and
Tai-Hoon Cho and
Young Shik Moon and
Sung-Han Park},
title = {Visual inspection system for the classification of solder
joints},
journal = {Pattern Recognition},
volume = {32},
number = {4},
year = {1999},
pages = {565-575},
ee = {http://dx.doi.org/10.1016/S0031-3203(98)00103-4},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2004-03-08 by Michael Ley (ley@uni-trier.de)