BibTeX record journals/pieee/TraiolaVGBB20

download as .bib file

@article{DBLP:journals/pieee/TraiolaVGBB20,
  author       = {Marcello Traiola and
                  Arnaud Virazel and
                  Patrick Girard and
                  Mario Barbareschi and
                  Alberto Bosio},
  title        = {A Survey of Testing Techniques for Approximate Integrated Circuits},
  journal      = {Proc. {IEEE}},
  volume       = {108},
  number       = {12},
  pages        = {2178--2194},
  year         = {2020},
  url          = {https://doi.org/10.1109/JPROC.2020.2999613},
  doi          = {10.1109/JPROC.2020.2999613},
  timestamp    = {Tue, 01 Dec 2020 09:11:33 +0100},
  biburl       = {https://dblp.org/rec/journals/pieee/TraiolaVGBB20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics