Edge Detection and Linear Feature Extraction Using a 2-D Random Field Model.

Yi-Tong Zhou V. Venkateswar Rama Chellappa Edge Detection and Linear Feature Extraction Using a 2-D Random Field Model. 84-95 1989 11 IEEE Trans. Pattern Anal. Mach. Intell. 1 http://computer.org/tpami/tp1989/i0084abs.htm db/journals/pami/pami11.html#ZhouVC89