Haruo Yoda Yozo Ohuchi Yuzo Taniguchi Masakazu Ejiri An Automatic Wafer Inspection System Using Pipelined Image Processing Techniques. 4-16 1988 10 IEEE Trans. Pattern Anal. Mach. Intell. 1 http://computer.org/tpami/tp1988/i0004abs.htm db/journals/pami/pami10.html#YodaOTE88