Stop the war!
Остановите войну!
for scientists:
default search action
BibTeX record journals/pami/Pau83
@article{DBLP:journals/pami/Pau83, author = {Louis{-}Fran{\c{c}}ois Pau}, title = {Integrated Testing and Algorithms for Visual Inspection of Integrated Circuits}, journal = {{IEEE} Trans. Pattern Anal. Mach. Intell.}, volume = {5}, number = {6}, pages = {602--608}, year = {1983}, url = {https://doi.org/10.1109/TPAMI.1983.4767449}, doi = {10.1109/TPAMI.1983.4767449}, timestamp = {Tue, 16 Jun 2020 11:34:38 +0200}, biburl = {https://dblp.org/rec/journals/pami/Pau83.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.