Anil K. Jain Yi Chen Meltem Demirkus Pores and Ridges: High-Resolution Fingerprint Matching Using Level 3 Features. 15-27 2007 29 IEEE Trans. Pattern Anal. Mach. Intell. 1 http://doi.ieeecomputersociety.org/10.1109/TPAMI.2007.17 db/journals/pami/pami29.html#JainCD07