Gaudenz Danuser Markus A. Stricker Parametric Model Fitting: From Inlier Characterization to Outlier Detection. 263-280 1998 20 IEEE Trans. Pattern Anal. Mach. Intell. 3 http://www.computer.org/tpami/tp1998/i0263abs.htm db/journals/pami/pami20.html#DanuserS98