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@article{DBLP:journals/mva/KubotaTMS05,
author = {Toshiro Kubota and
Parag Talekar and
Xianyun Ma and
Tangali S. Sudarshan},
title = {A nondestructive automated defect detection system for silicon
carbide wafers},
journal = {Mach. Vis. Appl.},
volume = {16},
number = {3},
year = {2005},
pages = {170-176},
ee = {http://dx.doi.org/10.1007/s00138-004-0169-y},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2006-05-31 by Michael Ley (ley@uni-trier.de)