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BibTeX record journals/mr/ZhangWHCCLHLYY16
@article{DBLP:journals/mr/ZhangWHCCLHLYY16, author = {Wenqi Zhang and Tzuo{-}Li Wang and Yan{-}hua Huang and Tsu{-}Ting Cheng and Shih{-}Yao Chen and Yiying Li and Chun{-}Hsiang Hsu and Chih{-}Jui Lai and Wen{-}Kuan Yeh and Yilin Yang}, title = {Influence of fin number on hot-carrier injection stress induced degradation in bulk FinFETs}, journal = {Microelectron. Reliab.}, volume = {67}, pages = {89--93}, year = {2016}, url = {https://doi.org/10.1016/j.microrel.2016.10.015}, doi = {10.1016/J.MICROREL.2016.10.015}, timestamp = {Sat, 14 Mar 2020 15:27:47 +0100}, biburl = {https://dblp.org/rec/journals/mr/ZhangWHCCLHLYY16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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