BibTeX record journals/mr/ZhangWHCCLHLYY16

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@article{DBLP:journals/mr/ZhangWHCCLHLYY16,
  author       = {Wenqi Zhang and
                  Tzuo{-}Li Wang and
                  Yan{-}hua Huang and
                  Tsu{-}Ting Cheng and
                  Shih{-}Yao Chen and
                  Yiying Li and
                  Chun{-}Hsiang Hsu and
                  Chih{-}Jui Lai and
                  Wen{-}Kuan Yeh and
                  Yilin Yang},
  title        = {Influence of fin number on hot-carrier injection stress induced degradation
                  in bulk FinFETs},
  journal      = {Microelectron. Reliab.},
  volume       = {67},
  pages        = {89--93},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.10.015},
  doi          = {10.1016/J.MICROREL.2016.10.015},
  timestamp    = {Sat, 14 Mar 2020 15:27:47 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ZhangWHCCLHLYY16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}