BibTeX record journals/mr/ZecriBGNBN03

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@article{DBLP:journals/mr/ZecriBGNBN03,
  author       = {M. Zecri and
                  P. Besse and
                  Philippe Givelin and
                  M. Nayrolles and
                  Marise Bafleur and
                  Nicolas Nolhier},
  title        = {Determination of the {ESD} Failure Cause Through its Signature},
  journal      = {Microelectron. Reliab.},
  volume       = {43},
  number       = {9-11},
  pages        = {1551--1556},
  year         = {2003},
  url          = {https://doi.org/10.1016/S0026-2714(03)00283-X},
  doi          = {10.1016/S0026-2714(03)00283-X},
  timestamp    = {Tue, 05 Jul 2022 16:10:36 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/ZecriBGNBN03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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