BibTeX record journals/mr/ZampardiCBL12

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@article{DBLP:journals/mr/ZampardiCBL12,
  author       = {Peter J. Zampardi and
                  Cristian Cismaru and
                  Hal Banbrook and
                  Bin Li},
  title        = {Measuring seam/crack formation in interconnect metallization},
  journal      = {Microelectron. Reliab.},
  volume       = {52},
  number       = {12},
  pages        = {2870--2874},
  year         = {2012},
  url          = {https://doi.org/10.1016/j.microrel.2012.08.025},
  doi          = {10.1016/J.MICROREL.2012.08.025},
  timestamp    = {Sat, 22 Feb 2020 19:27:44 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ZampardiCBL12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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