@article{DBLP:journals/mr/YuanSZEDS07,
  author    = {Cadmus A. Yuan and
               Olaf van der Sluis and
               G. Q. (Kouchi) Zhang and
               Leo J. Ernst and
               Willem D. van Driel and
               Richard B. R. van Silfhout},
  title     = {Molecular simulation on the material/interfacial strength
               of the low-dielectric materials},
  journal   = {Microelectronics Reliability},
  volume    = {47},
  number    = {9-11},
  year      = {2007},
  pages     = {1483-1491},
  ee        = {http://dx.doi.org/10.1016/j.microrel.2007.07.052},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}