BibTeX record: journals/mr/YuanSZEDS07

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@article{DBLP:journals/mr/YuanSZEDS07,
  author    = {Cadmus A. Yuan and
               Olaf van der Sluis and
               G. Q. (Kouchi) Zhang and
               Leo J. Ernst and
               Willem D. van Driel and
               Richard B. R. van Silfhout},
  title     = {Molecular simulation on the material/interfacial strength of the low-dielectric
               materials},
  journal   = {Microelectronics Reliability},
  volume    = {47},
  number    = {9-11},
  pages     = {1483--1491},
  year      = {2007},
  url       = {http://dx.doi.org/10.1016/j.microrel.2007.07.052},
  doi       = {10.1016/j.microrel.2007.07.052},
  timestamp = {Thu, 16 Sep 2010 11:46:20 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/journals/mr/YuanSZEDS07},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}