BibTeX record journals/mr/YenYWHYH12

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@article{DBLP:journals/mr/YenYWHYH12,
  author       = {H. D. Yen and
                  Jiann{-}Shiun Yuan and
                  Ruey{-}Lue Wang and
                  G. W. Huang and
                  W. K. Yeh and
                  F. S. Huang},
  title        = {{RF} stress effects on {CMOS} LC-loaded {VCO} reliability evaluated
                  by experiments},
  journal      = {Microelectron. Reliab.},
  volume       = {52},
  number       = {11},
  pages        = {2655--2659},
  year         = {2012},
  url          = {https://doi.org/10.1016/j.microrel.2012.04.007},
  doi          = {10.1016/J.MICROREL.2012.04.007},
  timestamp    = {Fri, 19 Jan 2024 08:33:20 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/YenYWHYH12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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