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DBLP Record 'journals/mr/YangAWBBRETH04'

BibTeX

@article{DBLP:journals/mr/YangAWBBRETH04,
  author    = {L. Yang and
               Asen Asenov and
               J. R. Watling and
               M. Bori\c{c}i and
               J. R. Barker and
               Scott Roy and
               K. Elgaid and
               I. Thayne and
               T. Hackbarth},
  title     = {Impact of device geometry and doping strategy on linearity
               and RF performance in Si/SiGe MODFETs},
  journal   = {Microelectronics Reliability},
  volume    = {44},
  number    = {7},
  year      = {2004},
  pages     = {1101-1107},
  ee        = {http://dx.doi.org/10.1016/j.microrel.2004.04.003},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

Copyright © 2008-07-12 by Michael Ley (ley@uni-trier.de)