BibTeX
@article{DBLP:journals/mr/YangAWBBRETH04,
author = {L. Yang and
Asen Asenov and
J. R. Watling and
M. Bori\c{c}i and
J. R. Barker and
Scott Roy and
K. Elgaid and
I. Thayne and
T. Hackbarth},
title = {Impact of device geometry and doping strategy on linearity
and RF performance in Si/SiGe MODFETs},
journal = {Microelectronics Reliability},
volume = {44},
number = {7},
year = {2004},
pages = {1101-1107},
ee = {http://dx.doi.org/10.1016/j.microrel.2004.04.003},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2008-07-12 by Michael Ley (ley@uni-trier.de)