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@article{DBLP:journals/mr/YanagisawaK03a,
author = {Takeshi Yanagisawa and
Takeshi Kojima},
title = {Degradation of InGaN blue light-emitting diodes under continuous
and low-speed pulse operations},
journal = {Microelectronics Reliability},
volume = {43},
number = {6},
year = {2003},
pages = {977-980},
ee = {http://dx.doi.org/10.1016/S0026-2714(03)00093-3},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2007-03-25 by Michael Ley (ley@uni-trier.de)