BibTeX record journals/mr/YamaguchiWMEHHL18

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@article{DBLP:journals/mr/YamaguchiWMEHHL18,
  author       = {Shimpei Yamaguchi and
                  Liesbeth Witters and
                  J{\'{e}}r{\^{o}}me Mitard and
                  Geert Eneman and
                  Geert Hellings and
                  Andriy Hikavyy and
                  Roger Loo and
                  Naoto Horiguchi},
  title        = {Scalability comparison between raised- and embedded-SiGe source/drain
                  structures for Si\({}_{\mbox{0.55}}\)Ge\({}_{\mbox{0.45}}\) implant
                  free quantum well pFET},
  journal      = {Microelectron. Reliab.},
  volume       = {83},
  pages        = {157--161},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2018.03.006},
  doi          = {10.1016/J.MICROREL.2018.03.006},
  timestamp    = {Sat, 30 Sep 2023 10:21:36 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/YamaguchiWMEHHL18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}