BibTeX record journals/mr/WuerflBBCHIKKLSSWZ11

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@article{DBLP:journals/mr/WuerflBBCHIKKLSSWZ11,
  author       = {Joachim W{\"{u}}rfl and
                  Eldad Bahat{-}Treidel and
                  Frank Brunner and
                  E. Cho and
                  Oliver Hilt and
                  Ponky Ivo and
                  A. Knauer and
                  Paul Kurpas and
                  Richard Lossy and
                  Matthias Schulz and
                  S. Singwald and
                  Markus Weyers and
                  Rimma Zhytnytska},
  title        = {Reliability issues of GaN based high voltage power devices},
  journal      = {Microelectron. Reliab.},
  volume       = {51},
  number       = {9-11},
  pages        = {1710--1716},
  year         = {2011},
  url          = {https://doi.org/10.1016/j.microrel.2011.07.017},
  doi          = {10.1016/J.MICROREL.2011.07.017},
  timestamp    = {Thu, 14 Oct 2021 09:38:37 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/WuerflBBCHIKKLSSWZ11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}