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BibTeX record journals/mr/WuYB15
@article{DBLP:journals/mr/WuYB15, author = {Chunlei Wu and Suying Yao and Corinne Berg{\`{e}}s}, title = {Leakage current study and relevant defect localization in integrated circuit failure analysis}, journal = {Microelectron. Reliab.}, volume = {55}, number = {3-4}, pages = {463--469}, year = {2015}, url = {https://doi.org/10.1016/j.microrel.2015.01.005}, doi = {10.1016/J.MICROREL.2015.01.005}, timestamp = {Sat, 22 Feb 2020 19:27:29 +0100}, biburl = {https://dblp.org/rec/journals/mr/WuYB15.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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