BibTeX record journals/mr/WuSLMS04

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@article{DBLP:journals/mr/WuSLMS04,
  author       = {T. Wu and
                  Theo Smedes and
                  J. P. Lokker and
                  S.{-}N. Mei and
                  J. W. Slotboom},
  title        = {A case study of {ESD} failures at random levels: analysis, explanation
                  and solution},
  journal      = {Microelectron. Reliab.},
  volume       = {44},
  number       = {9-11},
  pages        = {1823--1827},
  year         = {2004},
  url          = {https://doi.org/10.1016/j.microrel.2004.07.092},
  doi          = {10.1016/J.MICROREL.2004.07.092},
  timestamp    = {Sat, 22 Feb 2020 19:28:59 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/WuSLMS04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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