BibTeX record journals/mr/WuMRDGLR03

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@article{DBLP:journals/mr/WuMRDGLR03,
  author       = {C.{-}T. Wu and
                  A. Mieckowski and
                  R. S. Ridley and
                  G. Dolny and
                  T. Grebs and
                  J. Linn and
                  Jerzy Ruzyllo},
  title        = {Effect of nitridation on the reliability of thick gate oxides},
  journal      = {Microelectron. Reliab.},
  volume       = {43},
  number       = {1},
  pages        = {43--47},
  year         = {2003},
  url          = {https://doi.org/10.1016/S0026-2714(02)00122-1},
  doi          = {10.1016/S0026-2714(02)00122-1},
  timestamp    = {Thu, 07 May 2020 09:22:37 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/WuMRDGLR03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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