BibTeX record journals/mr/WuLLWTSZYWZ16

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@article{DBLP:journals/mr/WuLLWTSZYWZ16,
  author       = {Wangran Wu and
                  J. Lu and
                  Chang Liu and
                  Heng Wu and
                  Xiaoyu Tang and
                  Jiabao Sun and
                  Rui Zhang and
                  Wenjie Yu and
                  Xi Wang and
                  Yi Zhao},
  title        = {Gate length dependence of bias temperature instability behavior in
                  short channel {SOI} MOSFETs},
  journal      = {Microelectron. Reliab.},
  volume       = {62},
  pages        = {79--81},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.03.002},
  doi          = {10.1016/J.MICROREL.2016.03.002},
  timestamp    = {Sat, 22 Feb 2020 19:27:12 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/WuLLWTSZYWZ16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}