BibTeX record: journals/mr/WuHL03

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@article{DBLP:journals/mr/WuHL03,
  author    = {J. D. Wu and
               C. Y. Huang and
               C. C. Liao},
  title     = {Fracture strength characterization and failure analysis of silicon
               dies.},
  journal   = {Microelectronics Reliability},
  year      = {2003},
  volume    = {43},
  number    = {2},
  pages     = {269--277},
  url       = {http://dx.doi.org/10.1016/S0026-2714(02)00314-1},
  doi       = {10.1016/S0026-2714(02)00314-1},
  timestamp = {Tue, 02 Sep 2014 20:01:39 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/journals/mr/WuHL03},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}