BibTeX record journals/mr/WelBBHW07

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@article{DBLP:journals/mr/WelBBHW07,
  author       = {P. J. van der Wel and
                  J. R. de Beer and
                  R. J. M. van Boxtel and
                  Y. Y. Hsieh and
                  Y. C. Wang},
  title        = {Effect of oval defects in GaAs on the reliability of SiN\({}_{\mbox{x}}\)
                  metal-insulator-metal capacitors},
  journal      = {Microelectron. Reliab.},
  volume       = {47},
  number       = {8},
  pages        = {1188--1193},
  year         = {2007},
  url          = {https://doi.org/10.1016/j.microrel.2007.01.089},
  doi          = {10.1016/J.MICROREL.2007.01.089},
  timestamp    = {Sat, 22 Feb 2020 19:29:17 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/WelBBHW07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}