DBLP BibTeX Record 'journals/mr/WeirLSA05'

@article{DBLP:journals/mr/WeirLSA05,
  author    = {Bonnie E. Weir and
               Che-Choi Leung and
               Paul J. Silverman and
               Muhammad A. Alam},
  title     = {Gate dielectric breakdown in the time-scale of ESD events},
  journal   = {Microelectronics Reliability},
  volume    = {45},
  number    = {3-4},
  year      = {2005},
  pages     = {427-436},
  ee        = {http://dx.doi.org/10.1016/j.microrel.2004.12.004},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}