BibTeX record: journals/mr/WeirLSA05

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@article{DBLP:journals/mr/WeirLSA05,
  author    = {Bonnie E. Weir and
               Che{-}Choi Leung and
               Paul J. Silverman and
               Muhammad A. Alam},
  title     = {Gate dielectric breakdown in the time-scale of {ESD} events},
  journal   = {Microelectronics Reliability},
  volume    = {45},
  number    = {3-4},
  pages     = {427--436},
  year      = {2005},
  url       = {http://dx.doi.org/10.1016/j.microrel.2004.12.004},
  doi       = {10.1016/j.microrel.2004.12.004},
  timestamp = {Tue, 27 Mar 2007 09:39:08 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/journals/mr/WeirLSA05},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}