BibTeX record journals/mr/WatanabeO12

download as .bib file

@article{DBLP:journals/mr/WatanabeO12,
  author       = {Akihiko Watanabe and
                  Ichiro Omura},
  title        = {Real-time failure imaging system under power stress for power semiconductors
                  using Scanning Acoustic Tomography {(SAT)}},
  journal      = {Microelectron. Reliab.},
  volume       = {52},
  number       = {9-10},
  pages        = {2081--2086},
  year         = {2012},
  url          = {https://doi.org/10.1016/j.microrel.2012.06.090},
  doi          = {10.1016/J.MICROREL.2012.06.090},
  timestamp    = {Sat, 22 Feb 2020 19:28:21 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/WatanabeO12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.