BibTeX record journals/mr/WatanabeKYOHKMS18

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@article{DBLP:journals/mr/WatanabeKYOHKMS18,
  author       = {Kazuki Watanabe and
                  Yoshiharu Kariya and
                  Naoyuki Yajima and
                  Kizuku Obinata and
                  Yoshiyuki Hiroshima and
                  Shunichi Kikuchi and
                  Akiko Matsui and
                  Hiroshi Shimizu},
  title        = {Low-cycle fatigue testing and thermal fatigue life prediction of electroplated
                  copper thin film for through hole via},
  journal      = {Microelectron. Reliab.},
  volume       = {82},
  pages        = {20--27},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2017.12.045},
  doi          = {10.1016/J.MICROREL.2017.12.045},
  timestamp    = {Wed, 22 Feb 2023 08:18:09 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/WatanabeKYOHKMS18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}