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BibTeX record journals/mr/WangWHSHG18
@article{DBLP:journals/mr/WangWHSHG18, author = {Tun Wang and Baoming Wang and Aman Haque and Michael Snure and Eric Heller and Nicholas Glavin}, title = {Mechanical stress effects on electrical breakdown of freestanding GaN thin films}, journal = {Microelectron. Reliab.}, volume = {81}, pages = {181--185}, year = {2018}, url = {https://doi.org/10.1016/j.microrel.2017.12.033}, doi = {10.1016/J.MICROREL.2017.12.033}, timestamp = {Sat, 30 Sep 2023 10:21:36 +0200}, biburl = {https://dblp.org/rec/journals/mr/WangWHSHG18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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