BibTeX record journals/mr/WangLGWTZ12

download as .bib file

@article{DBLP:journals/mr/WangLGWTZ12,
  author       = {Bo Wang and
                  Jiajun Li and
                  Anthony Gallagher and
                  James Wrezel and
                  Pongpinit Towashirporn and
                  Naiqin Zhao},
  title        = {Drop impact reliability of Sn-1.0Ag-0.5Cu {BGA} interconnects with
                  different mounting methods},
  journal      = {Microelectron. Reliab.},
  volume       = {52},
  number       = {7},
  pages        = {1475--1482},
  year         = {2012},
  url          = {https://doi.org/10.1016/j.microrel.2012.02.001},
  doi          = {10.1016/J.MICROREL.2012.02.001},
  timestamp    = {Sat, 22 Feb 2020 19:29:04 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/WangLGWTZ12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics