BibTeX record journals/mr/WangDWNCSSBLGCB18

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@article{DBLP:journals/mr/WangDWNCSSBLGCB18,
  author       = {Haibin Wang and
                  Xixi Dai and
                  Yangsheng Wang and
                  Issam Nofal and
                  Li Cai and
                  Zicai Shen and
                  Wanxiu Sun and
                  Jinshun Bi and
                  Bo Li and
                  Gang Guo and
                  Li Chen and
                  Sang H. Baeg},
  title        = {A single event upset tolerant latch design},
  journal      = {Microelectron. Reliab.},
  volume       = {88-90},
  pages        = {909--913},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2018.07.019},
  doi          = {10.1016/J.MICROREL.2018.07.019},
  timestamp    = {Wed, 26 Oct 2022 22:55:46 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/WangDWNCSSBLGCB18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}