BibTeX record journals/mr/VoldmanAACDMW01

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@article{DBLP:journals/mr/VoldmanAACDMW01,
  author       = {Steven H. Voldman and
                  W. Anderson and
                  R. Ashton and
                  M. Chaine and
                  Charvaka Duvvury and
                  T. Maloney and
                  E. Worley},
  title        = {A strategy for characterization and evaluation of {ESD} robustness
                  of {CMOS} semiconductor technologies},
  journal      = {Microelectron. Reliab.},
  volume       = {41},
  number       = {3},
  pages        = {335--348},
  year         = {2001},
  url          = {https://doi.org/10.1016/S0026-2714(00)00236-5},
  doi          = {10.1016/S0026-2714(00)00236-5},
  timestamp    = {Mon, 14 Sep 2020 12:20:22 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/VoldmanAACDMW01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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