BibTeX record: journals/mr/TyaginovSEJPSOCG11

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@article{DBLP:journals/mr/TyaginovSEJPSOCG11,
  author    = {Stanislav Tyaginov and
               Ivan Starkov and
               Hubert Enichlmair and
               C. Jungemann and
               Jong Mun Park and
               E. Seebacher and
               R. L. de Orio and
               Hajdin Ceric and
               Tibor Grasser},
  title     = {An analytical approach for physical modeling of hot-carrier induced
               degradation},
  journal   = {Microelectronics Reliability},
  year      = {2011},
  volume    = {51},
  number    = {9-11},
  pages     = {1525--1529},
  url       = {http://dx.doi.org/10.1016/j.microrel.2011.07.089},
  doi       = {10.1016/j.microrel.2011.07.089},
  timestamp = {Thu, 18 Sep 2014 05:41:38 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/journals/mr/TyaginovSEJPSOCG11},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}