TyaginovSEJPSOCG11'

@article{DBLP:journals/mr/TyaginovSEJPSOCG11,
  author    = {Stanislav Tyaginov and
               Ivan Starkov and
               Hubert Enichlmair and
               C. Jungemann and
               Jong Mun Park and
               E. Seebacher and
               R. L. de Orio and
               Hajdin Ceric and
               Tibor Grasser},
  title     = {An analytical approach for physical modeling of hot-carrier
               induced degradation},
  journal   = {Microelectronics Reliability},
  volume    = {51},
  number    = {9-11},
  year      = {2011},
  pages     = {1525-1529},
  ee        = {http://dx.doi.org/10.1016/j.microrel.2011.07.089},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}