BibTeX record journals/mr/TsaiK10

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@article{DBLP:journals/mr/TsaiK10,
  author       = {Hui{-}Wen Tsai and
                  Ming{-}Dou Ker},
  title        = {Design of 2xVDD-tolerant mixed-voltage {I/O} buffer against gate-oxide
                  reliability and hot-carrier degradation},
  journal      = {Microelectron. Reliab.},
  volume       = {50},
  number       = {1},
  pages        = {48--56},
  year         = {2010},
  url          = {https://doi.org/10.1016/j.microrel.2009.09.004},
  doi          = {10.1016/J.MICROREL.2009.09.004},
  timestamp    = {Sat, 22 Feb 2020 19:28:30 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/TsaiK10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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