TremouillesTRNVG07'

@article{DBLP:journals/mr/TremouillesTRNVG07,
  author    = {D. Tr{\'e}mouilles and
               Steven Thijs and
               Philippe Roussel and
               M. I. Natarajan and
               Vesselin K. Vassilev and
               Guido Groeseneken},
  title     = {Transient voltage overshoot in TLP testing - Real or artifact?},
  journal   = {Microelectronics Reliability},
  volume    = {47},
  number    = {7},
  year      = {2007},
  pages     = {1016-1024},
  ee        = {http://dx.doi.org/10.1016/j.microrel.2006.11.004},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}