BibTeX record journals/mr/ThomasFM01

download as .bib file

@article{DBLP:journals/mr/ThomasFM01,
  author       = {Stephen Thomas III and
                  Charles H. Fields and
                  Meena Madhav},
  title        = {{RF} modeling approach to determining end-of-life reliability for
                  InP-based HBTs},
  journal      = {Microelectron. Reliab.},
  volume       = {41},
  number       = {8},
  pages        = {1129--1135},
  year         = {2001},
  url          = {https://doi.org/10.1016/S0026-2714(01)00085-3},
  doi          = {10.1016/S0026-2714(01)00085-3},
  timestamp    = {Mon, 08 Jan 2024 21:46:50 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ThomasFM01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.